smartctl 7.4 2023-08-01 r5530 [OpenBSD 7.4 i386] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 80GN Device Model: IC25N060ATMR04-0 Serial Number: MRA30BKEHTR16H Firmware Version: MO3OAD4A User Capacity: 60,011,642,880 bytes [60.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5528 ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a Local Time is: Wed Dec 20 19:24:11 2023 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 53) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 1 2 Throughput_Performance P-S--- 105 105 040 - 5853 3 Spin_Up_Time POS--- 131 131 033 - 1 4 Start_Stop_Count -O--C- 097 097 000 - 5451 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 120 120 040 - 36 9 Power_On_Hours -O--C- 076 076 000 - 10820 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 098 098 000 - 4256 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 099 099 000 - 242 193 Load_Cycle_Count -O--C- 033 033 000 - 672819 194 Temperature_Celsius -O---- 122 122 000 - 45 (Min/Max -3/64) 196 Reallocated_Event_Count -O--CK 100 100 000 - 9 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x06 SL R/O 1 SMART self-test log 0x80-0x9f SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 23 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 23 occurred at disk power-on lifetime: 5500 hours (229 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 12 6e 21 e2 Error: UNC at LBA = 0x02216e12 = 35745298 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 01 12 6e 21 e2 00 01:12:45.800 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:45.800 READ DMA 40 00 01 11 6e 21 e2 00 01:12:45.800 READ VERIFY SECTOR(S) 40 00 02 11 6e 21 e2 00 01:12:42.200 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:42.200 READ DMA Error 22 occurred at disk power-on lifetime: 5500 hours (229 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 12 6e 21 e2 Error: UNC at LBA = 0x02216e12 = 35745298 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 02 11 6e 21 e2 00 01:12:42.200 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:42.200 READ DMA 40 00 02 0f 6e 21 e2 00 01:12:42.200 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:42.200 READ DMA 40 00 04 13 6e 21 e2 00 01:12:42.200 READ VERIFY SECTOR(S) Error 21 occurred at disk power-on lifetime: 5500 hours (229 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 12 6e 21 e2 Error: UNC at LBA = 0x02216e12 = 35745298 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 04 0f 6e 21 e2 00 01:12:38.600 READ VERIFY SECTOR(S) c8 00 01 bb f7 48 e4 00 01:12:38.600 READ DMA 40 00 08 17 6e 21 e2 00 01:12:38.600 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:38.600 READ DMA 40 00 08 0f 6e 21 e2 00 01:12:34.900 READ VERIFY SECTOR(S) Error 20 occurred at disk power-on lifetime: 5500 hours (229 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 05 12 6e 21 e2 Error: UNC at LBA = 0x02216e12 = 35745298 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 08 0f 6e 21 e2 00 01:12:34.900 READ VERIFY SECTOR(S) 40 00 10 0f 6e 21 e2 00 01:12:31.300 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:31.300 READ DMA 40 00 10 ff 6d 21 e2 00 01:12:31.300 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:31.300 READ DMA Error 19 occurred at disk power-on lifetime: 5500 hours (229 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 0d 12 6e 21 e2 Error: UNC at LBA = 0x02216e12 = 35745298 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 40 00 10 0f 6e 21 e2 00 01:12:31.300 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:31.300 READ DMA 40 00 10 ff 6d 21 e2 00 01:12:31.300 READ VERIFY SECTOR(S) c8 00 01 00 00 00 e0 00 01:12:31.300 READ DMA 40 00 20 1f 6e 21 e2 00 01:12:31.300 READ VERIFY SECTOR(S) SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 10812 - # 2 Short offline Completed without error 00% 10797 - # 3 Short offline Completed without error 00% 10781 - # 4 Short offline Completed without error 00% 10755 - # 5 Extended offline Completed without error 00% 10743 - # 6 Short offline Completed without error 00% 10741 - # 7 Short offline Completed without error 00% 10726 - # 8 Short offline Completed without error 00% 10711 - # 9 Short offline Completed without error 00% 10696 - #10 Short offline Completed without error 00% 10696 - #11 Short offline Completed without error 00% 10696 - #12 Short offline Completed without error 00% 10696 - #13 Short offline Completed without error 00% 10696 - #14 Short offline Completed without error 00% 10696 - #15 Short offline Completed without error 00% 10680 - #16 Short offline Completed without error 00% 10665 - #17 Extended offline Completed without error 00% 10652 - #18 Short offline Completed without error 00% 10650 - #19 Short offline Completed without error 00% 10635 - #20 Short offline Completed without error 00% 10621 - #21 Short offline Completed without error 00% 10607 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported